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Bias temperature reliability of high k dielectric hfo2 based mos capacitors

Singh, Priya

Bias temperature reliability of high k dielectric hfo2 based mos capacitors [Text] Priya Singh Guided by Savita Maurya - Lucknow Integral University Lucknow - 73p,;30cm

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Subjects--Topical Terms:
Electronics and Communication

Index Terms--Curriculum Objective:
Electronics Circuits and system

Dewey Class. No.: 621.382072 / SIN/B

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