Image from Amazon.com
VLSI Testing: digital and mixed analogue/digital techniques. Stanley L. Hurst [Text]
Material type:
TextLanguage: English891 , Digital Analogue Series: IEE Circuits, Devices and Systems Series; 9Publication details: London Institution of Electrical Engineers 1998Description: xx, 532p.; 25cmISBN: - 9780852969014
- 621.381 HUR/V
| Item type | Current library | Call number | Status | Notes | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
RESERVE BOOKS
|
CENTRAL LIBRARY | 621.381 HUR/V (Browse shelf(Opens below)) | Not For Loan | 034285 | 034285 |
Browsing CENTRAL LIBRARY shelves, Shelving location: Reserve Book Section Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
|
||
| 621.381 HOW/M Microelectronics: an integrated approach | 621.381 HSU/M MEMS & Microsytems: design and Manufacture | 621.381 HSU/M MEMS & Microsytems: design and Manufacture | 621.381 HUR/V VLSI Testing: digital and mixed analogue/digital techniques. | 621.381 IBR/I Introduction to Applied Fuzzy Electronics | 621.381 IBR/I Introduction to Applied Fuzzy Electronics | 621.381 INT Integrated Interconnected Technologies for 3D Nano Electronic System |
Includes list of symbols and abbreviations
There are no comments on this title.
Log in to your account to post a comment.
