Bias temperature reliability of high k dielectric hfo2 based mos capacitors Priya Singh Guided by Savita Maurya [Text]

By: Material type: TextTextLanguage: English Publication details: Lucknow Integral University LucknowDescription: 73p,;30cmSubject(s): DDC classification:
  • 621.382072 SIN/B
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Copy number Status Notes Date due Barcode
Dissertation-Master Degree CENTRAL LIBRARY ELECTRONIC 621.382072 SIN/B (Browse shelf(Opens below)) 1 Not For Loan Electronics and Communication DM1556

Included CD

There are no comments on this title.

to post a comment.