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Defect-Oriented Testing for Nano- Metric CMOS VLSI Circuits Manoj Sachdev and Jose Pineda De Gyvez [Text]
Material type:
TextLanguage: English Publication details: New Delhi New Age Internatinal 2010Edition: 2ndDescription: 328p; 25cmISBN: - 9788184894295
- 621.39732 SAC/D
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TEXT BOOK
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CENTRAL LIBRARY | 621.39732 SAC/D (Browse shelf(Opens below)) | Available | 050027 | 050027 | ||
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TEXT BOOK
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CENTRAL LIBRARY | 621.39732 SAC/D (Browse shelf(Opens below)) | Available | 050023 | 050023 | ||
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TEXT BOOK
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CENTRAL LIBRARY | 621.39732 SAC/D (Browse shelf(Opens below)) | Available | 050024 | 050024 | ||
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TEXT BOOK
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CENTRAL LIBRARY | 621.39732 SAC/D (Browse shelf(Opens below)) | Available | 050025 | 050025 | ||
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TEXT BOOK
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CENTRAL LIBRARY | 621.39732 SAC/D (Browse shelf(Opens below)) | Available | 050026 | 050026 | ||
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CENTRAL LIBRARY | 621.39732 SAC/D (Browse shelf(Opens below)) | Not For Loan | 045304 | 045304 |
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| 621.39732 RAZ/D Design of Analog CMOS Integrated Circuits | 621.39732 RAZ/D Design of Analog CMOS Integrated Circuits | 621.39732 RAZ/D Design of Analog CMOS Integrated Circuits | 621.39732 SAC/D Defect-Oriented Testing for Nano- Metric CMOS VLSI Circuits | 621.39732 SAC/D Defect-Oriented Testing for Nano- Metric CMOS VLSI Circuits | 621.39732 SAC/D Defect-Oriented Testing for Nano- Metric CMOS VLSI Circuits | 621.39732 SAC/D Defect-Oriented Testing for Nano- Metric CMOS VLSI Circuits |
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