TY  - BOOK
AU  - Sachdev,Manoj
AU  - Gyvez,Jose Pineda De
TI  - Defect-Oriented Testing for Nano- Metric CMOS VLSI Circuits 
SN  - 9788184894295
U1  - 621.39732 
PY  - 2010///
CY  - New Delhi
PB  - New Age Internatinal
KW  - Software Testing Techniques: findings the defects that matter
KW  - CS
N1  - index included
ER  -