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Bias temperature reliability of high k dielectric hfo2 based mos capacitors Priya Singh Guided by Savita Maurya [Text] by
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Lucknow Integral University Lucknow
Availability: Items available for reference: CENTRAL LIBRARY: Not For Loan (1)Call number: 621.382072 SIN/B.

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Proton irradiation study of HFO2 a high K dielectric Supriya Awasthi Guided by Savita Maurya [Text] by
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Lucknow Integral University 2017
Availability: Items available for reference: CENTRAL LIBRARY: Not For Loan (1)Call number: 621.382072 AWA/P.

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